Undergraduate Course: Design and Manufacturability; Digital Systems Lab 3 (ELEE09031)
|School||School of Engineering
||College||College of Science and Engineering
|Credit level (Normal year taken)||SCQF Level 9 (Year 3 Undergraduate)
||Availability||Available to all students
|Summary||The lecture based part of the course introduces a structured and quantitative approach to electronic product design for manufacture (DFM); the link between design & manufacture; statistical process control (SPC); and design & analysis of experiments (DOE).
The purpose of this lab course is to produce students who are capable of developing synchronous digital circuits from high level functional specifications and prototyping them on FPGA hardware using a standard hardware description language (HDL).
Why design for manufacture?
Models of the manufacturing process
Defects and Yield
Reliability and cost
Space Tower group exercise
Solar Tower group exercise
DAM Lectures - SPC/DOE
History, context and background
Permutations & combinations
Probability (including Bayes)
Design of experiments
Regression and correlation
Lab 1 - Week 1: "HelloWorld" and "HelloLotsofWorlds" modules
Lab 2 - Week 2: "HelloSynchronousWorld" and "ShiftingTheWorld" modules
Lab 3 - Week 3: "ShiftingManyWorlds" and "CountingTheWorld" modules
Lab 4 - Week 4: "TimingTheWorld" module and assessment
Lab 5 - Week 5: "TimingTheWorldInDecimalNow" and "DecodingTheWorld" modules
Lab 6 - Week 6: "ColouringTheWorld " module
Lab 7 - Week 7: "TheWorldofStateMachines" module
Lab 8 - Week 8: "TheWorldofLinkedStateMachine" module an assessment
Lab 9 - Week 9: "Snake Game" module
Lab 10 - Week 10: "Snake Game" module and assessment
Information for Visiting Students
|Pre-requisites||Knowledge of basic analogue and digital circuit theory.
|High Demand Course?
Course Delivery Information
|Not being delivered|
On completion of this course, the student will be able to:
- Understanding and ability to articulate the concept of quality in the design and manufacture of products, the effect of defects created in the manufacturing process, quantitative methods of measuring and minimizing defects.
- Knowledge of the fundamentals of Statistical Process Control (SPC) and Design of Experiments (DoE).
- Master a hardware description language Verilog;
- Implement digital circuit concepts on a practical FPGA board.
|Statistics for Engineering and the Sciences, Sixth Edition William M. Mendenhall, Terry L. Sincich (CRC Press)|
Introduction to Statistical Quality Control, D C Montgomery (John Wiley)
Design and Analysis of Experiments, D C Montgomery (John Wiley)
Statistical Process Control and Quality Improvement, G M Smith (Prentice-Hall)
Statistical Quality Control, E L Grant & R S Levenworth (McGraw-Hill)
Quality Donna, C S Summers (Prentice-Hall)
Statistical Methods for Quality, I Miller & M Miller (Prentice-Hall)
Digital Design, An Embedded Systems Approach Using Verilog, Peter J Ashenden, Morgan Kaufmann, 2007, ISBN-13: 978-0123695277
|Graduate Attributes and Skills
|Keywords||Design for Manufacture,6-sigma,design of experiments,statistical process control,Bayes Theorem
|Course organiser||Prof Ian Underwood
Tel: (0131 6)50 5631 / 7474
|Course secretary||Mrs Megan Inch-Kellingray
Tel: (0131 6)51 7079